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The Intellium™ Z30 can provide non-contact measurement of flat or spherical surfaces and transmitted wavefront of optical components and assemblies. Measure optical components such as flats, prisms, lenses, or precision metal parts such as bearings, sealing surfaces, contact lens molds, or polished ceramics. Measurements can be made using simple basic visual fringe inspection, IntelliPhase™ static carrier analysis, or phase-modulated interferogram analysis. The Intellium™ Z30 provides flexibility to handle today’s industrial applications at an unprecedented value.
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Applications
- Surface measurement of spherical or flat components
- Machined surfaces
- Optical components
- Mini Wafers
- Contact lenses
- Radius of curvature measurements
Main Features & Benefits
- Fast & simple operation for production floor QC
- Compact footprint: 80mm by 180mm takes little space
- Vertical up or down configurations
- Alignment mode and focus adjustment
- IntelliWave™ Interferometric Analysis Software compatible
- Fast & accurate measurements using Fringe Tracing or IntelliPhase™ Spatial Carrier Method
Intellium™ Z30 Fizeau Interferometer Specifications
Light source |
635nm ± 5nm |
Type |
Fizeau Interferometer |
Clear Aperture |
φ30mm |
Sensitivity |
λ/20 |
Transmission Flat |
λ/20 |
Magnification |
1x |
XY Stage |
Stroke Range ± 1mm |
Z Stage |
Stroke Range ± 1mm |
Dimension |
80mm × 180mm × 215mm Approx. |
Mass |
2.2 Kg Approx. |
Power Requirements |
AC100V-240V 50/60Hz 20W |
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