Products
   Optics Metrology
      Intellium™ H2000
      Intellium™ Asphere
      Intellium™ Z100
      Intellium™ Z40
      Intellium™ Z30

      Compare Intelliums™
       Accessories PDF 1.44 MB
   Compare Instruments

quote

 

Intellium™ Z100 Fizeau Interferometer

The Most Compact 100mm Fizeau Interferometer with a 190mm by 338mm footprint

 
 

Intellium™ Z100 interferometerThe Intellium™ Z100 interferometer provides non-contact measurement of flat or spherical surfaces and transmitted wavefronts of optical components and assemblies. Measurements can be made using simple basic visual fringe inspection, static fringe analysis, or phase-modulated interferogram analysis.

The Intellium™ Z100 uses IntelliWave™, the de-facto standard interferometry software for device independent interferogram analysis. Vibration-insensitive acquisition is supported by IntelliPhase™, one of the many versatile features of IntelliWave.The Intellium™ Z100 provides flexibility to handle today’s industrial applications at a significantly reduced cost as compared to other instruments.


Download Brochure - 185 KB

Available Intellium™ Z100 Models

Intellium™ Z100
100mm Fizeau Interferometer for wavelength of 632.8nm

Intellium™ Z100HR
Equipped with the highest resolution camera (2048x1536 pixels) available for performing mildly aspheric measurements and other large dynamic range applications.

Intellium™ Z100NIR
The 1053nm/1064nm models use a high resolution camera allowing to measure highly aberrated parts with the same performance as the standard Intellium™ Z100. Other wavelengths may be available upon request. The 1300nm wavelength model uses a micro-bolometer camera for NIR sensitive measurements.

 

Applications

  • Transmission and surface testing of optics.
  • Optical components and assembly alignment
  • OEM metrology integrated systems
Main Features & Benefits
  • Provides precision and accuracy in a small package.
  • 1x to 6x zoom (standard feature).
  • Vibration-insensitivity can be accomplished with the IntelliPhase™ Spatial Carrier Method.
  • Rugged design.
  • Compatible with all industry standard reference optics and 100mm (4”) interferometer accessories.
  • Premium-quality measurements at an affordable price.
  • Configurations include horizontal, vertical look up, and vertical look down.
  • Optional horizontal workstation allows radius of curvature measurements.

 

Intellium™ Z100 Fizeau Interferometer Specifications

Technology
Phase-shifting and/or IntelliPhase™
System

Test Beam

102mm (4")

Zoom (6x)

Rotary dial (continuous)

Focus

+/- 2.0m

Intensity

Rotary dial

Alignment

Simple two spot alignment

Alignment View

± 1.8 degrees

Part Viewing

Live video on computer screen

 Performance
 
Z100 
HR 
NIR
1053 - 1064
1300

Repeatability 3-flat 1

λ/300 PV

RMS Repeatability 2

λ/2000

Calibrated Accuracy

λ/100

Height Resolution

λ/8000

Spatial Resolution

640 x 480
2048 x 1536
1280 x 1024
640 x 480

Fringe Resolution

180 fringes
560 fringes
300 fringes
180 fringes

Digitization

8 bits
10 bits
10 bits
8 bits

Acquisition Time

300ms
600ms
300ms
300ms

Averaging Modes

Intensity and Phase
 Laser Beam

Source

Helium-Neon
632.8nm, 2mw
1053nm
50mw
1064nm
50mw
1300nm
50mw

Polarization

Circular (Linear Optional)

Coherence

>100 meters

Calibrated Accuracy

λ/100

Height Resolution

λ/8000

Electrical

Power

110/240 Volts, 50/60 Hz, 50 Watts

Mechanical

Dimensions

338mm x 190mm x 254mm
 13.5” x 7.5” x 10”

Weight

14 kg (39 lb)

Environmental Req.

Temperature

15 to 30 °C (59 to 86°F)

Rate of Temp. change

< 1.0°C per 15 min

Humidity

Relative 5% to 95%, no condensing

Vibration Isolation

Required for frequencies from 1 Hz to 120 Hz
   

Computer

(optional)


Assuming reasonable vibration suppression (isolation table, minimal thermals, etc.)

  1. 1 sigma repeatability of 3-Flat Test with 16 averages per set.
  2. 1 sigma of the rms for 10 data sets, each an average of 16 measurements.

 

 
   
Home  |  

©2008 Engineering Synthesis Design, Inc. All Rights Reserved.

 
homepage contact