The Intellium™ Asphere Fizeau interferometer provides fast, non-contact and high-resolution measurement of aspheric surfaces. Native sub-Nyquist sampling technology provides transmitted wavefront measurements of aspherical optical components and assemblies, such as optical pick-up lenses and micro optics used in micro-cameras. The Intellium™ Asphere uses IntelliWave™, the de-facto standard interferometry software for device-independent interferogram analysis.

The Intellium™ Asphere provides ease, efficiency, and flexibility to handle today’s aspheric optics metrology at a significantly reduced cost compared to other instruments.

The Intellium™ Asphere uses a new interferometric analysis method called sub-Nyquist Interferometry (SNI) that overcomes the limitations of measuring large wavefront slopes existing with conventional phase-shifting interferometry (PSI). This change allows for a significant increase in the range of measurement or amount of asphericity that can be measured by the interferometer, with no increase in the amount of required data. For some types of wavefronts, this improvement will be greater then two orders of magnitude. This new technique is an extension of PSI and maintains the precision inherent to PSI.  ESDI’s IntelliWave™ software performs data acquisition, Sub-Nyquist phase unwrapping, and retrace error compensation in one step, automatically, and in seconds (not minutes).

 

• Transmission and surface characterization of aspherical, spherical & flat optics
• Optical component and assembly alignment
• Integration into OEM manufacturing & metrology systems

Features & Benefits

• Data acquisition, processing and retrace error compensation in seconds, NOT minutes
• No special tools or long scanning process required for aspheric surface characterization
• Uncompromised precision and accuracy in a compact and robust package
• Superior cost – performance benefit
• Operates on the world-renowned IntelliWave™ 6 software platform

Intellium™ Asphere Fizeau Interferometer Specifications

Technology	Phase-Shifting Fizeau with Sub-Nyquist Sampling
System
Output Aperture	100 mm (4.0”)
Zoom	N/A
Focus	N/A
Intensity	Rotary dial
Alignment	Simple two spot alignment
Alignment View	± 1.8 degrees
Viewing	Live video on computer screen
Performance
Accuracy	< 0.5 waves PV
Maximum Slope	6.3mrad relative to best fit sphere
Aspheric Departure	80µm from spherical vertex
RMS Repeatability2	λ/500
Height Resolution	λ/8000
Spatial Resolution	512 x 512
Fringe Resolution	2,000 fringes
Digitization	8 bits
Acquisition Time	300ms
Averaging Modes	Intensity and Phase
Laser
Source	20mW 642 nm Diode
Polarization	Circular
Coherence	>100m
Electrical
Power	110/240 Volts, 50/60 Hz, 50 Watts
Mechanical
Dimensions	338mm x 190mm x 254mm  13.5” x  7.5” x 10”
Weight	14 kg (39 lb)
Environmental Req.
Temperature	15 to 30°C (59 to 86°F)
Rate of Temp. Change	<1.0°C per 15 min
Humidity	Relative 5% to 95%, no condensing
Vibration Isolation	Required for frequencies from 1 Hz to 120 Hz
Computer	Included
Measurements assume reasonable vibration suppression (isolation table, etc.) 1 sigma of the rms for 10 data sets, each an average of 16 measurements