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High Accuracy Measurement Capability with
Unsurpassed Flexibility & Versatility
The Intellium™ Z100 interferometer provides non-contact measurement of flat or spherical surfaces along with transmitted wavefront measurements of optical components and assemblies. Measurements may be made using basic visual fringe inspection, static fringe analysis, or phase-modulated interferogram analysis. The Intellium™ Z100 may be integrated with ESDI’s world-renowned IntelliWave™ acquisition and analysis software to provide the end user with superior measurement and analysis capability. The Intellium™ Z100 provides the versatility and flexibility to handle today’s advanced applications with an unrivaled cost – performance benefit.
Available Models
Intellium™ Z100
100mm Fizeau Interferometer for wavelength of 632.8nm
Intellium™ Z100HR
Equipped with the highest resolution camera (2048x1536 pixels) available for performing mildly aspheric measurements and other large dynamic range applications.
Intellium™ Z100NIR
The 1053nm/1064nm models use a high resolution camera allowing to measure highly aberrated parts with the same performance as the standard Z100. Other wavelengths may be available upon request. The 1300nm wavelength model uses a micro-bolometer camera for NIR sensitive measurements.
Applications
- Measurement of flat, concave or convex surfaces
- Prism, corner cube, wedge angle & homogeneity measurements
- Measurement of machined, ceramic, and wafer/disk surfaces
- Wavefront analysis of optical systems & components
- Integration into OEM systems
Main Features & Benefits
- Total USB connectivity option (laptop or desktop)
- Excellent versatility, stability and repeatability
- 1x to 6x zoom, focus and attenuation controls
- Vibration-insensitivity may be accomplished via ESDI’s IntelliPhase™ static spatial carrier acquisition and analysis software
- Compact, lightweight and rugged design
- Compatible with all industry standard 4" (100mm) reference optics and accessories
- High accuracy measurements at an affordable price
- Configurations include horizontal, vertical look up and vertical look down
- Optional workstations for flat and short to long radius of curvature measurements
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