Happy Holiday
All of us
at ESDI wish you a happy holiday and thank you for being
our customers. We wish you a prosperous and successful
year in 2007.
This newsletter will be our last for
the year. As always, we hope you will find useful
information for your metrology needs.
Enjoy!
Intellium
Z100 HR
A major step up in
aspheric optics measurement. Intellium Z100 HR is the
highest resolution 100mm Fizeau interferometer available
on the market. The high resolution camera of 1.5kx2k
pixels allows this instrument to measure large slope
angles in transmission and reflection.
Vibration-insensitive acquisition is supported by
IntelliPhase, which is one of the many FREE versatile
features inside IntelliWave. This new model of the
Intellium Z100 maintains the compactness of its original
design; making this instrument the smallest in its
class. It can be easily mounted and integrated into
larger systems. Rest assured the Intellium Z100 HR is
backed up by a wide variety of accessories and complete
technical support from ESDI.
One
Day IntelliWave Refresher Workshop in San Jose,
California on Friday, 26 Jan 2007 (concurrently
with Photonics West 2007) for $495
Attend this workshop to explore the many
new functionalities inside the latest version
of IntelliWave. Learn many useful and advanced
features such as wedge measurement, automatic PZT
calibration, IntelliPhase, IntelliTrack, verifying the
quality of your transmission spheres, and more. The
workshop will be led by Raymond Castonguay. In
this workshop you will also be introduced
to our new IntelliStitch software. This software
allows stitching together multiple aperture measurements
for large optics (larger than your interferometer
aperture).
Enhance your interferometric measurement
knowledge through this workshop and please stop by at
our Booth #414 at Photonics West to find the latest
metrology instruments.
Tips &
Tricks
Wedge
Measurement
A Fizeau type interferometer is
probably the best to measure small wedge angles of
optical elements. There are two options for this kind of
measurements: in transmission and in reflection. Both of
them require use of a reference surface. Typically a
flat mirror or other flat reflective surface can be used
for this purpose. The reference plane should be large
enough to create an easily recognizable area in the
final phase map. The reference should be mounted in
front of the interferometer on a tip-tilt stage and
adjusted in such a way that ideally the interference
fringes from the reference are nulled (it is ok to have
few fringes in the field of view).
In case of
wedge measurement of a transparent part the measurement
is done in transmission while the measured element is
placed between the reference surface and the
interferometer. The reflection from the front and back
surface of the measured part should be eliminated by
tilting it slightly so that the reflections are just
outside the interferometer’s acceptance angle. A tilt of
the wavefront inside the area of the object with respect
to the reference corresponds to the optical wedge in the
measured part. In order to obtain the value of the
geometrical wedge it is necessary to take into account
the fact that light refracts in the element, so
information about refractive index of the material at
the wavelength at which the measurement was taken is
necessary.
To measure wedge of an opaque element,
the measurement is done in reflection. The reference
should be adjusted as before and the back surface of the
measured part is placed in contact with the reference
surface. By doing this we assure that the back surface
is parallel to the reference. The tilt angle of the
wavefront obtained for the measured part with respect to
the reference is directly proportional to the
geometrical wedge angle of the measured
element.
The IntelliWave software provides full
support for both types of measurements. The wedge
calculations can be completely customized and automated.
In that respect, the IntelliWave offers many additional
options including operations on multiple regions, proper
scaling, use of real units and much
more.
Upcoming
Events
Mark your calendar for IntelliWave
Training in 2007. Re-sharpen your
interferometric measurement & analysis skills. Learn
more about the new features in IntelliWave and see
how it can 'boost' the quality of your measurement
analysis and productivity.
- 26 Jan:
1-Day IntelliWave Refresher Workshop, San Jose,
California
- 16-19 Apr: 4-Day, Tucson, Arizona
-
9-12 Jul: 4-Day, Tucson, Arizona
- 15-18 Oct: 4-Day,
Tucson, Arizona
Visit us at the following
exhibitions:
-
BIOS 20-21 Jan 2007, San Jose, California, USA. Booth #
8414
- Photonics West 23-25 Jan 2007, San Jose,
California, USA. Booth # 414.
Product Demo:
IntelliWave 2007
Best Regards,
Raymond
Castonguay, President
ESDI